- All sections
- G - Physics
- G01R - Measuring electric variables; measuring magnetic variables
- G01R 31/3193 - Tester hardware, i.e. output processing circuits with comparison between actual response and known fault-free response
Patent holdings for IPC class G01R 31/3193
Total number of patents in this class: 206
10-year publication summary
|
17
|
15
|
15
|
33
|
17
|
20
|
14
|
25
|
11
|
3
|
| 2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Advantest Corporation | 1939 |
13 |
| International Business Machines Corporation | 60644 |
9 |
| Samsung Electronics Co., Ltd. | 131630 |
7 |
| Texas Instruments Incorporated | 19376 |
6 |
| Teradyne, Inc. | 579 |
6 |
| Qualcomm Incorporated | 76576 |
5 |
| Micron Technology, Inc. | 24960 |
4 |
| SK Hynix Inc. | 11030 |
4 |
| NXP USA, Inc. | 4155 |
4 |
| Changxin Memory Technologies, Inc. | 4732 |
4 |
| Intel Corporation | 45621 |
3 |
| Renesas Electronics Corporation | 6305 |
3 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 36809 |
3 |
| Altera Corporation | 2241 |
3 |
| Media Tek Singapore Pte. Ltd. | 934 |
3 |
| Realtek Semiconductor Corp. | 3028 |
3 |
| IBM United Kingdom Limited | 4467 |
3 |
| Microchip Technology Incorporated | 2644 |
3 |
| ROHDE & Schwarz GmbH & Co. KG | 1831 |
3 |
| STMicroelectronics International N.V. | 635 |
3 |
| Other owners | 114 |